Matias V., Coulter Y., Sheehan C., Yung C., Glyantsev V., Huh J., Turner P., Dawley J., Maiorov B.M.
Ключевые слова: HTS, coated conductors, fabrication, template layers, planarization, solution techniques, IBAD process, RCE-CDR process, critical caracteristics, n-value, critical current, critical current density, angular dependence, thickness dependence, magnetic field dependence, homogeneity, growth rate, presentation
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, co-evaporation process, cycling, planarization, fabrication, solution techniques, roughness, microstructure, width
Matias V., Li Q., Johnson P.D., Solovyov V., Sheehan C., Zhou J., Jaroszynski J., Si W., Jie Q., Dimitrov I.
Matias V., Maiorov B., Moeckly B., Coulter Y., Sheehan C., Yung C., Glyantsev V., Ruby W., Huh J., Turner P.
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, solution techniques, planarization, long conductors, co-evaporation process, critical caracteristics, critical current, critical current density, n-value, Jc/B curves, angular dependence, pinning, substrate Hastelloy, fabrication
Ключевые слова: HTS, YBCO, coated conductors, fabrication, co-evaporation process, presentation, critical current, critical caracteristics
Kreiskott S., Arendt P.N., Foltyn S.R., Matias V., Dowden P.C., Coulter J.Y., Gibbons B.J., Sheehan C.J.
Ключевые слова: HTS, YBCO, coated conductors, reel-to-reel process, IBAD process, template layers, buffer layers, PLD process, fabrication, magnetic properties
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